IEEE International Instrumentation and Measurement Technology Conference 2025

CELISCA contributed on I2MTC 2025, the international flagship conference of the IEEE Instrumentation and Measurement Society with a tutorial and a scientific talk. Both of these contributions focus to automated process measurement of compound and element specific measurement technologies and applications.

 

Compound-Oriented Measurement Technology is a specialized area within measurement technology that requires a more comprehensive approach than standard measurement techniques. These methods can be complex and involve several stages, including sampling, sample preparation, transportation, reformatting, measurement, and data processing. The intricate nature of these procedures requires a validation, which consideres all subprocesses within the overall workflow for accurate measurement results. In contrast to most physical measurements, compound-oriented measurements qualify (identify) and quantify the measurand of interest. Often, the measurand must be selected from multi-component mixtures of different compounds embedded in biological, chemical, medical, industrial, or environmental matrices. Compound-oriented measurements can be improved using robotic systems to increase sample throughput, ensure the safety of personnel, and enhance measurement accuracy.

The tutorial ("Measurement Validation in Automated Compound Oriented Measurements") provides an in-depth exploration of the theoretical and practical aspects of compound-oriented measurements, the validation strategies required for both manual and automated methods, and the key parameters for evaluating measurement systems.

The scientific talk ("Multi-element and Multi-organ Heavy Metal Measurements Using ICP-MS - A Contribution to Reference Value Generation in Human Tissues") deals with a methodical development to determine trace elements, especially heavy metals, in the human's body  and their distribution in the different organs providing a pathway into the determination of reference values for modern automated measurement processes. 

Tutorial & scientific talk at IEEE-I2MTC 2025